
檢驗(yàn)點(diǎn)
Move the short to Adjust testpoint 3, R1, and RV1, thereby providing VF cancellation, to read the same value. 你還需要一種能夠從結(jié)果的微波中提取特征的手段。
For a fabrication testpoint report, this involves the _Fabrication Testpoint Setup_ dialog. 對(duì)于加工測(cè)試點(diǎn)報(bào)告,在加工測(cè)試點(diǎn)設(shè)置對(duì)話框中設(shè)置;
You can make some adjustments to the circuit.For example, with no diode inserted, you can short the Adjust testpoint 1 to 4. 測(cè)試二極管的反向恢復(fù)特性通常需要復(fù)雜的測(cè)試設(shè)備。
NOTE. W510 schematic contains 2 TestPoints, A (primary) and B (secondary). In case if unlock fails using single TestPoint A, please perform the process, using both TestPoints simultaneously. 如果已經(jīng)打開自動(dòng)解鎖選項(xiàng),設(shè)備已經(jīng)自動(dòng)解鎖并關(guān)閉,如果沒(méi)有打開自動(dòng)解鎖,則此設(shè)備可以執(zhí)行重寫字庫(kù),修復(fù)底層,解鎖或備份等操作